Reduce the number of cycles the "long" test runs for, for perf reasons

pull/946/head
Jesse Vincent 4 years ago
parent 895f5f1e00
commit 240f141538
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GPG Key ID: CC228463465E40BC

@ -26,7 +26,7 @@ constexpr uint32_t t_0{0};
constexpr uint32_t t_1{1}; constexpr uint32_t t_1{1};
constexpr uint32_t t_100{100}; constexpr uint32_t t_100{100};
constexpr uint32_t t_500{500}; constexpr uint32_t t_500{500};
constexpr uint32_t t_500_000{500000}; constexpr uint32_t t_100_000{100000};
using ::testing::IsEmpty; using ::testing::IsEmpty;
@ -65,7 +65,7 @@ TEST_F(SimulatorTiming, ZeroTimeElapses) {
TEST_F(SimulatorTiming, LongTimeElapses) { TEST_F(SimulatorTiming, LongTimeElapses) {
// Bigger number than uint16_t can hold // Bigger number than uint16_t can hold
assertTimeElapses(t_500_000); assertTimeElapses(t_100_000);
} }
TEST_F(SimulatorTiming, 3msPerCycleTestRunCycles) { TEST_F(SimulatorTiming, 3msPerCycleTestRunCycles) {

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